Zeiss Metrotom CT Scanner

The Zeiss Metrotom 800 X-ray microscope enables cutting-edge, nondestructive tomographic imaging. Micron-scale X-ray tomography (μ-XCT) allows for the collection of both surface and internal renderings, which are used to distinguish between phases and identify defects such as porosity. Our lab offers the unique ability to first nondestructively characterize pore distributions in sample parts using the Zeiss Xradia Versa, then to mechanically test those same parts using the load frames described in other pages, to correlate defect structures with mechanical properties.

Georgia Institute of Technology
North Avenue, Atlanta, GA 30332

© Georgia Institute of Technology

Designed with ❤️️ by Blue Light Labs