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Measuring Stress-Induced Martensite Microstructures Using Far-Field High-Energy Diffraction Microscopy

Bucsek, A.N., Dale, D., Ko, J.Y.P., Chumlyakov, Y., Stebner, A.P.

2018, Acta Crystallographica Section A, A74: 425–446, 10.1107/S205327331800880X.

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